Research on optoelectronic technology for detecting flaws on internal surface of cylinder

被引：0
|
作者：
Che, Y [1 ]
Shen, YZ [1 ]
Ma, H [1 ]
机构：
[1] Changchun Inst Opt & Fine Mech, Dept Electroopt Engn, Changchun 130022, Peoples R China
来源：
AUTOMATED OPTICAL INSPECTION FOR INDUSTRY: THEORY, TECHNOLOGY, AND APPLICATIONS II | 1998年 / 3558卷
关键词：
flaws; optoelectronic probe; image-processing and identification;
D O I：
10.1117/12.318438
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An optoelectronic instrument is introduced,in which the charge - coupled device(CCD) camera and an optoelectronic probe are used to inspect the internal surface quality of cylinder with real - time and automatically. In this report,the working principle of the device is expounded,and the structure of the optoelectronic probe is explained.
引用
收藏
页码：451 / 454
页数：4
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