Effects of urban microcellular environments on ray-tracing-based coverage predictions

被引:0
|
作者
Liu, Zhongyu [1 ,2 ]
Guo, Lixin [1 ,2 ]
Guan, Xiaowei [1 ,2 ]
Sun, Jiejing [2 ]
机构
[1] Xidian Univ, State Key Lab Integrated Serv Networks, Tai Bai Rd, Xian 710071, Shaanxi Provinc, Peoples R China
[2] Xidian Univ, Sch Phys & Optoelect Engn, Tai Bai Rd, Xian 710071, Shaanxi Provinc, Peoples R China
基金
中国国家自然科学基金; 美国国家科学基金会;
关键词
PROPAGATION PREDICTION; MODEL; DIFFRACTION;
D O I
10.1364/JOSAA.33.001738
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The ray-tracing (RT) algorithm, which is based on geometrical optics and the uniform theory of diffraction, has become a typical deterministic approach of studying wave-propagation characteristics. Under urban microcellular environments, the RT method highly depends on detailed environmental information. The aim of this paper is to provide help in selecting the appropriate level of accuracy required in building databases to achieve good tradeoffs between database costs and prediction accuracy. After familiarization with the operating procedures of the RT-based prediction model, this study focuses on the effect of errors in environmental information on prediction results. The environmental information consists of two parts, namely, geometric and electrical parameters. The geometric information can be obtained from a digital map of a city. To study the effects of inaccuracies in geometry information (building layout) on RT-based coverage prediction, two different artificial erroneous maps are generated based on the original digital map, and systematic analysis is performed by comparing the predictions with the erroneous maps and measurements or the predictions with the original digital map. To make the conclusion more persuasive, the influence of random errors on RMS delay spread results is investigated. Furthermore, given the electrical parameters' effect on the accuracy of the predicted results of the RT model, the dielectric constant and conductivity of building materials are set with different values. The path loss and RMS delay spread under the same circumstances are simulated by the RT prediction model. (C) 2016 Optical Society of America
引用
收藏
页码:1738 / 1746
页数:9
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