A new framework for generating optimal march tests for memory arrays

被引：16

作者：

Zarrineh, K ^{[1
]}

Upadhyaya, SJ ^{[1
]}

Chakravarty, S ^{[1
]}

机构：

[1] SUNY Buffalo, Dept Elect & Comp Engn, Buffalo, NY 14260 USA

来源：

INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/TEST.1998.743139

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Given a set of memory array faults the problem of computing an optimal march test that detects all specified memory array faults is addressed. In this paper, we propose a novel approach in which every memory array fault is modeled by a set of primitive memory faults. A primitive march test is defined for each primitive memory fault. We show that march tests that detect the specified memory array faults are composed of primitive march tests. A method to compute the optimal march tests for the specified memory array faults is described. A set of examples to illustrate the approach is presented.

引用

页码：73 / 82

页数：10

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