Long-term Stability of Lithium Niobate on Insulator PICs for Metrological Applications

被引：0

作者：

Obrzud, Ewelina ^{[1
]}

Sattari, Hamed ^{[1
]}

Voumard, Thibault ^{[2
]}

Choong, Gregory ^{[1
]}

Denis, Severine ^{[1
]}

Leo, Jacopo ^{[1
]}

Wildi, Thibault ^{[2
]}

Dubochet, Olivier ^{[1
]}

Despont, Michel ^{[1
]}

Lecomte, Steve ^{[1
]}

Herr, Tobias ^{[2
]}

Ghadimi, Amir ^{[1
]}

Brasch, Victor ^{[1
]}

机构：

[1] CSEM Swiss Ctr Elect & Microtechnol, CH-2000 Neuchatel, Switzerland

[2] DESY, CFEL Ctr Free Electron Laser Sci, D-22607 Hamburg, Germany

来源：

2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2021年

关键词：

D O I：

10.1109/CLEO/Europe-EQEC52157.2021.9541590

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页数：1

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