Voltage stress-induced hot carrier effects on SiGe HBT VCO

被引：2
|
作者：
Yu, CZ [1 ]
Xiao, EJ
Yuan, JS
机构：
[1] Univ Cent Florida, Dept Elect & Comp Engn, Orlando, FL 32826 USA
[2] Univ Texas, Dept Elect & Comp Engn, Arlington, TX 76019 USA
来源：
MICROELECTRONICS RELIABILITY | 2005年 / 45卷 / 9-11期
关键词：
D O I：
10.1016/j.microrel.2005.07.026
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents the hot carrier (HC) induced performance degradation in a 10 GHz voltage controlled oscillator (VCO) with SiGe heterojunction bipolar transistors (HBTs). SiGe device characteristics due to HC stress are examined experimentally. The vertical bipolar inter-company (VBIC) model parameters extracted from measured data are used in Cadence SpectreRF simulation to verify the HC effect on the VCO. The VCO shows significant vulnerability to hot carriers. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码：1402 / 1405
页数：4
相关论文
共 50 条
  • [31] Impact of oxygen in electrical properties and hot-carrier stress-induced degradation of GaN high electron mobility transistors
    陈丽香
    马敏
    曹杰程
    孙佳惟
    阙妙玲
    孙云飞
    Chinese Physics B, 2021, 30 (10) : 762 - 766
  • [32] Impact of oxygen in electrical properties and hot-carrier stress-induced degradation of GaN high electron mobility transistors*
    Chen, Lixiang
    Ma, Min
    Cao, Jiecheng
    Sun, Jiawei
    Que, Miaoling
    Sun, Yunfei
    CHINESE PHYSICS B, 2021, 30 (10)
  • [33] STRESS-INDUCED SENSITIZATION TO AMPHETAMINE AND MORPHINE PSYCHOMOTOR EFFECTS DEPEND ON STRESS-INDUCED CORTICOSTERONE SECRETION
    DEROCHE, V
    PIAZZA, PV
    CASOLINI, P
    MACCARI, S
    LEMOAL, M
    SIMON, H
    BRAIN RESEARCH, 1992, 598 (1-2) : 343 - 348
  • [34] On stress-induced voltage hysteresis in lithium ion batteries: Impacts of surface effects and interparticle compression
    ChuanJian Jin
    HaoLiang Li
    YiCheng Song
    Bo Lu
    A. K. Soh
    JunQian Zhang
    Science China Technological Sciences, 2019, 62 : 1357 - 1364
  • [35] On stress-induced voltage hysteresis in lithium ion batteries:Impacts of surface effects and interparticle compression
    JIN ChuanJian
    LI HaoLiang
    SONG YiCheng
    LU Bo
    SOH A.K.
    ZHANG JunQian
    Science China(Technological Sciences), 2019, (08) : 1357 - 1364
  • [36] On stress-induced voltage hysteresis in lithium ion batteries:Impacts of surface effects and interparticle compression
    JIN ChuanJian
    LI HaoLiang
    SONG YiCheng
    LU Bo
    SOH AK
    ZHANG JunQian
    Science China(Technological Sciences), 2019, 62 (08) : 1357 - 1364
  • [37] On stress-induced voltage hysteresis in lithium ion batteries: Impacts of surface effects and interparticle compression
    Jin Chuanhan
    Li HaoLiang
    Song YiCheng
    Lu Bo
    Soh, A. K.
    Zhang JunQian
    SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2019, 62 (08) : 1357 - 1364
  • [38] DEVICE SIMULATION FOR EFFECTS OF MECHANICAL STRESS ON ELECTRICAL PERFORMANCES OF NMOSFETS: THE IMPACTS OF STRESS-INDUCED CHANGE OF INTRINSIC CARRIER DENSITY
    Koganemaru, Masaaki
    Tada, Naohiro
    Ikeda, Toru
    Miyazaki, Noriyuki
    PROCEEDINGS OF THE ASME INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, 2013, VOL 1, 2014,
  • [39] A low voltage micromachined optical switch by stress-induced bending
    Chen, RT
    Nguyen, H
    Wu, MC
    MEMS '99: TWELFTH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST, 1999, : 424 - 428
  • [40] INTERFACE TRAP EFFECTS ON THE HOT-CARRIER INDUCED DEGRADATION OF MOSFETS DURING DYNAMIC STRESS
    SUEHLE, JS
    RUSSELL, TJ
    GALLOWAY, KF
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) : 1359 - 1365
12345