Probing Polaritons in 2D Materials with Synchrotron Infrared Nanospectroscopy

被引:30
|
作者
Barcelos, Ingrid D. [1 ]
Bechtel, Hans A. [2 ]
de Matos, Christiano J. S. [3 ]
Bahamon, Dario A. [3 ]
Kaestner, Bernd [4 ]
Maia, Francisco C. B. [1 ]
Freitas, Raul O. [1 ]
机构
[1] Brazilian Ctr Res Energy & Mat CNPEM, Brazilian Synchrotron Light Lab LNLS, BR-13083970 Campinas, SP, Brazil
[2] Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA
[3] Univ Prebiteriana Mackenzie, MackGraphe Graphene & Nanomat Res Ctr, BR-01302907 Sao Paulo, SP, Brazil
[4] PTB, Abbestr 2-12, D-10587 Berlin, Germany
基金
欧盟地平线“2020”;
关键词
2D materials; far-infrared SINS; graphene; hexagonal boron nitride; infrared synchrotron nanospectroscopy; polaritons; s-SNOM; ELECTRON-MOBILITY ENHANCEMENT; HEXAGONAL BORON-NITRIDE; PHONON-POLARITONS; GRAPHENE PLASMONICS; MONOLAYER MOS2; STRAIN; OXIDE; MICROSCOPY; SPECTROSCOPY; ABSORPTION;
D O I
10.1002/adom.201901091
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Polaritons, which are quasiparticles composed of a photon coupled to an electric or magnetic dipole, are a major focus in nanophotonic research of van der Waals (vdW) crystals and their derived 2D materials. For the variety of existing vdW materials, polaritons can be active in a broad range of the electromagnetic spectrum (meVs to eVs) and exhibit momenta much higher than the corresponding free-space radiation. Hence, the use of high momentum broadband sources or probes is imperative to excite those quasiparticles and measure the frequency-momentum dispersion relations, which provide insights into polariton dynamics. Synchrotron infrared nanospectroscopy (SINS) is a technique that combines the nanoscale spatial resolution of scattering-type scanning near-field optical microscopy with ultrabroadband synchrotron infrared radiation, making it highly suitable to probe and characterize a variety of vdW polaritons. Here, the advances enabled by SINS on the study of key photonic attributes of far- and mid-infrared plasmon- and phonon-polaritons in vdW and 2D crystals are reviewed. In that context the SINS technique is comprehensively described and it is demonstrated how fundamental polaritonic properties are retrieved for a range of atomically thin systems including hBN, MoS2, graphene and 2D heterostructures.
引用
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页数:16
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