Atomic force microscopy

Since the invention of the Scanning Tunneling Microscope (STM),a number of related surface probing techniques have been developed, capable of resolving single atoms or molecules at a free surface. In particular, the Atomic Force Microscopy (AFM) is well recognized as a promising tool for observing nanometer-scale structures of non-conductive surfaces, soft matter objects like single organic molecules, polymers, biological tissues, etc. Basic principles of operation of various Surface Probe Microscopy techniques application in various fields are discussed. Application of AFM Force Spectroscopy on polymer-coated surfaces is described.