Comparison of microwave inductors fabricated on silicon-on-sapphire and bulk silicon

被引:46
|
作者
Johnson, RA
Chang, CE
Asbeck, PM
Wood, ME
Garcia, GA
Lagnado, I
机构
[1] Dept. of Elec. and Comp. Engineering, University of California, San Diego, San Diego
[2] University of California, San Diego, CA
[3] Nav., Command, Contr., Ocean S., RDT and E Division (NRaD), San Diego
[4] Rockwell Science Center, Thousand Oaks
来源
关键词
D O I
10.1109/75.535833
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Inductors are important elements of microwave circuits that frequently require high self-resonant frequencies and high quality factors. In this work, circular spiral inductors fabricated on silicon-on-sapphire (SOS) and bulk silicon are compared. Due to the low-loss dielectric substrate, SOS inductors showed both higher self-resonant frequencies and higher quality factors than those fabricated on bulk silicon, Small-signal models extracted for the inductors confirm that the degradation of the inductor characteristics in bulk silicon stems from losses in the substrate.
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页码:323 / 325
页数:3
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