Attribute Control Charts for the Weibull Distribution under Truncated Life Tests

被引：52
|
作者：
Aslam, Muhammad [1 ]
Jun, Chi-Hyuck [2 ]
机构：
[1] King Abdulaziz Univ, Fac Sci, Dept Stat, Jeddah 21551, Saudi Arabia
[2] POSTECH, Dept Ind & Management Engn, Pohang, South Korea
来源：
QUALITY ENGINEERING | 2015年 / 27卷 / 03期
基金：
新加坡国家研究基金会;
关键词：
control chart; Weibull distribution; average run length; ECONOMIC-STATISTICAL DESIGN; NP CONTROL CHART; SKEWED POPULATIONS; (X)OVER-BAR; NONNORMALITY;
D O I：
10.1080/08982112.2015.1017649
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this article, an attribute control chart is proposed when the lifetime of a product follows a Weibull distribution, which is based on the number of failures from a truncated life test. The coefficients of the proposed control chart and the test duration are determined so that the average run length when the process is in control is close to the target value. Tables reporting the out-of-control average run lengths are given for various shift parameters. A case study is given to illustrate the proposed control chart for industrial use.
引用
收藏
页码：283 / 288
页数：6
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