Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

被引：29

作者：

Lin, Chi-Yuan ^{[1
,2
,3
]}

Cheng, Cheng-En ^{[1
,2
,3
]}

Wang, Shuai ^{[3
]}

Shiu, Hung Wei ^{[4
]}

Chang, Lo Yueh ^{[4
,5
]}

Chen, Chia-Hao ^{[4
]}

Lin, Tsung-Wu ^{[6
]}

Chang, Chen-Shiung ^{[1
,2
]}

Chien, Forest Shih-Sen ^{[3
]}

机构：

[1] Natl Chiao Tung Univ, Dept Photon, Hsinchu 30010, Taiwan

[2] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu 30010, Taiwan

[3] Tunghai Univ, Dept Appl Phys, Taichung 40704, Taiwan

[4] Natl Synchrotron Radiat Res Ctr, Hsinchu 30076, Taiwan

[5] Natl Tsing Hua Univ, Dept Phys, Hsinchu 30013, Taiwan

[6] Tunghai Univ, Dept Chem, Taichung 40704, Taiwan

来源：

JOURNAL OF PHYSICAL CHEMISTRY C | 2015年 / 119卷 / 23期

关键词：

PHOTOCATALYTIC REDUCTION; GRAPHITE; MONOLAYERS; DAMAGE; FILMS; TRANSPARENT; IRRADIATION; FABRICATION; NANOSHEETS; EVOLUTION;

D O I：

10.1021/jp512055g

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Synchrotron radiation soft X-ray was employed to reduce graphene oxide (GO) films in ultrahigh vacuum. The dissociation of oxygen-containing functional groups, and the formation of sp(2) C-C bonds were revealed by time-resolved in situ X-ray photoelectron spectroscopy, demonstrating the X-ray reduction of GO. The number of C-O bonds of G-O exhibited an exponential decay with exposure time. The X-ray reduction rate of G-O was positively correlated with the intensity of low-energy secondary electrons excited from substrates by soft X-ray, indicating the C-O bonds were dissociated by secondary electrons.

引用

页码：12910 / 12915

页数：6

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