Self-Supervised Feature Learning by Learning to Spot Artifacts

被引:63
|
作者
Jenni, Simon [1 ]
Favaro, Paolo [1 ]
机构
[1] Univ Bern, Bern, Switzerland
基金
瑞士国家科学基金会;
关键词
DEEP NETWORK;
D O I
10.1109/CVPR.2018.00289
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
We introduce a novel self-supervised learning method based on adversarial training. Our objective is to train a discriminator network to distinguish real images from images with synthetic artifacts, and then to extract features from its intermediate layers that can be transferred to other data domains and tasks. To generate images with artifacts, we pre-train a high-capacity autoencoder and then we use a damage and repair strategy: First, we freeze the autoencoder and damage the output of the encoder by randomly dropping its entries. Second, we augment the decoder with a repair network, and train it in an adversarial manner against the discriminator. The repair network helps generate more realistic images by inpainting the dropped feature entries. To make the discriminator focus on the artifacts, we also make it predict what entries in the feature were dropped. We demonstrate experimentally that features learned by creating and spotting artifacts achieve state of the art performance in several benchmarks.
引用
收藏
页码:2733 / 2742
页数:10
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