Atomic force measurement of low-frequency dielectric noise

被引：13

作者：

Walther, LE ^{[1
]}

Russell, EV

Israeloff, NE

Gomariz, HA

机构：

[1] Northeastern Univ, Dept Phys, Boston, MA 02115 USA

[2] Northeastern Univ, Ctr Interdisciplinary Res Complex Syst, Boston, MA 02115 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 24期

关键词：

D O I：

10.1063/1.121556

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Using noncontact scanning probe microscopy techniques, dielectric properties were studied on 50-nm-length scales in poly-vinyl-acetate (PVAc) and poly-methyl-methacrylate films. Low-frequency (1/f) fluctuations observed in the measurements, peaked in intensity near the glass transition temperature in PVAc. The noise is shown to arise from thermal dielectric polarization fluctuations. Analysis of this noise provides a noninvasive method of probing equilibrium nanometer-scale dynamical processes in dielectric materials and devices. (C) 1998 American Institute of Physics.

引用

页码：3223 / 3225

页数：3

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