Transmission electron microscopy investigation of InNAs on GaAs grown by molecular beam epitaxy

被引:8
|
作者
Hao, M
Sakai, S
Sugahara, T
Cheng, TS
Foxon, CT
机构
[1] Univ Tokushima, Dept Elect & Elect Engn, Tokushima 770, Japan
[2] Univ Nottingham, Dept Phys, Nottingham NG7 2RD, England
关键词
InNAs films; phases separation; XRD; TEM; EDX;
D O I
10.1016/S0022-0248(98)00335-2
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The InNAs films have been grown on GaAs substrates by molecular beam epitaxy using an RF-activated plasma N source. The properties of these films have been investigated by X-ray diffraction, transmission electron microscopy and energy dispersive X-ray spectroscopy mapping. Two phases, InNAs and InAs, were found in the InNAs films. The InNAs phase consists of pyramid-like islands connected to each other at the base and that most of the InAs grains grew between these InNAs islands in the shape of an inverse pyramid. Both InNAs and InAs are cubic and have the same crystallographic direction as the substrates. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:481 / 484
页数:4
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