Computer simulation on low energy ion implantation based on molecular dynamics methods

被引:0
|
作者
Ran, YJ [1 ]
Gao, WY [1 ]
Huang, R [1 ]
Yu, M [1 ]
Zhang, X [1 ]
Wang, YY [1 ]
机构
[1] Peking Univ, Inst Microelect, Beijing 100871, Peoples R China
来源
CHINESE JOURNAL OF ELECTRONICS | 2000年 / 9卷 / 04期
关键词
ion implantation; molecular dynamics; recoil interaction approximation; rare-event algorithm;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a reliable and efficient molecular dynamics program LEACS to simulate the low energy ion implantation, In our code, the newest physical models are included and a great number of efficient algorithms are used to conduct realistic and accurate simulations. By comparing our simulation results with the SIMS data for B, As and P ranging from 10 keV to 70 keV implantation, we verified the correctness and efficiency of our code.
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页码:359 / 363
页数:5
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