Measurement of Refractive Index Change in Nonlinear Crystals Using Wavefront Sensor

被引：0

作者：

Fuchimukai, Atsushi ^{[1
]}

Sasaki, Yoichi ^{[1
]}

Qu, Chen ^{[1
]}

Tamaru, Yuki ^{[1
]}

Miura, Taisuke ^{[1
]}

Matsunaga, Takashi ^{[1
]}

机构：

[1] Gigaphoton Inc, L400 Yokokurashinden, Oyama, Tochigi 3238558, Japan

来源：

2017 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR) | 2017年

关键词：

Wavelength conversion; deep ulitra violet; thermally induced effects; wavefront measurement;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We are developing the all-solid-state light source at 193-nm. In case of high average power wavelength conversion, thermally induced refractive index change induces phase mismatch in nonlinear crystal. We evaluated the refractive index change inside nonlinear crystals by using a large area wave front sensor with the spatial resolution of 44 microns.

引用

页数：2

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