Study on Barium Strontium Titanate thin films integrated on Si substrates by laser Molecular Beam Epitaxy

被引:0
|
作者
Zhou, X. Y. [1 ,2 ,3 ]
Zhou, Y. [4 ]
Wang, G. Y. [1 ,2 ]
Wang, Y. [1 ,2 ]
Chan, H. L. W. [1 ,2 ]
Choy, C. L. [1 ,2 ]
Cao, G. Z. [3 ]
机构
[1] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
[2] Mat Res Ctr, Hong Kong, Hong Kong, Peoples R China
[3] Univ Washington, Dept Mat Sci & Engn, Seattle, WA 98195 USA
[4] Shanghai Maritime Univ, Inst Marine mat Sci & Engn, Shanghai 200135, Peoples R China
关键词
barium strontium titanate; thin film; Laser MBE; tunability;
D O I
10.4028/www.scientific.net/AMR.79-82.823
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
(Ba,Sr)TiO3 thin film has been deposited on Si (001) wafer with the SiO2 layer as the block layer through laser molecular-beam epitaxy using an ultra thin Sr layer as template. X-ray diffraction measurements and the cross-sectional observations under transmission electron microscope indicated that BST was well crystallized. This deposition of Sr layer is considered to remove the thin SiO2 layer to produce a layer, which is crystallized and has a lattice structure matching with that of perovskite BST. The maximum in-plane dielectric tunability is calculated to be 50% at 1 GHz under a moderate DC bias field of 13.3 V/mu m. This BST/Si structure is believed to be a promising candidate in the development of ferroelectric BST-based microwave devices.
引用
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页码:823 / +
页数:2
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