Critical role of W deposition condition on spin-orbit torque induced magnetization switching in nanoscale W/CoFeB/MgO

被引:70
|
作者
Zhang, C. [1 ]
Fukami, S. [1 ,2 ,3 ,4 ]
Watanabe, K. [1 ]
Ohkawara, A. [1 ]
DuttaGupta, S. [1 ]
Sato, H. [2 ,3 ,4 ]
Matsukura, F. [1 ,2 ,4 ,5 ]
Ohno, H. [1 ,2 ,3 ,4 ,5 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Lab Nanoelect & Spintron, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, Ctr Spintron Integrated Syst, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
[3] Tohoku Univ, Ctr Innovat Integrated Elect Syst, Aoba Ku, 468-1 Aramaki Aza Aoba, Sendai, Miyagi 9800845, Japan
[4] Tohoku Univ, Ctr Spintron Res Network, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
[5] Tohoku Univ, WPI Adv Inst Mat Res, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
关键词
CHEMICAL-VAPOR-DEPOSITION; TUNGSTEN FILMS; BETA-TUNGSTEN; PRESSURE; TANTALUM; PHASE;
D O I
10.1063/1.4967475
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study the spin-orbit torque induced magnetization switching in W/CoFeB/MgO heterostructures with W deposited under different sputtering conditions. We show that the crystal structure and resistivity of W depend on the employed sputtering conditions. Switching current of nanoscale devices is smaller while effective anisotropy field is larger for the devices with more resistive W channel deposited at lower sputtering power and higher Ar gas pressure. The effective spin Hall angle evaluated from the switching probability varies by a factor of 2-3 depending on the W resistivity controlled by the sputtering conditions. Published by AIP Publishing.
引用
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页数:4
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