Photoemission characteristics of thin GaAs-based heterojunction photocathodes

被引:10
|
作者
Feng, Cheng [1 ]
Zhang, Yijun [1 ]
Qian, Yunsheng [1 ]
Shi, Feng [2 ]
Zou, Jijun [3 ]
Zeng, Yugang [4 ]
机构
[1] Nanjing Univ Sci & Technol, Inst Elect Engn & Optoelect Technol, Nanjing 210094, Jiangsu, Peoples R China
[2] Sci & Technol Low Light Level Night Vis Lab, Xian 710065, Peoples R China
[3] E China Inst Technol, Minist Educ, Engn Res Ctr Nucl Technol Applicat, Nanchang 330013, Peoples R China
[4] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, Changchun 130033, Peoples R China
基金
中国国家自然科学基金; 高等学校博士学科点专项科研基金;
关键词
ELECTRON-SPIN POLARIZATION; SEMICONDUCTOR PHOTOCATHODES; IMAGE INTENSIFIERS; MODE; ABSORPTION; INTERFACE; LAYER; CS;
D O I
10.1063/1.4905621
中图分类号
O59 [应用物理学];
学科分类号
摘要
To better understand the different photoemission mechanism of thin heterojunction photocathodes, the quantum efficiency models of reflection-mode and transmission-mode GaAs-based heterojunction photocathodes are revised based on one-dimensional continuity equations, wherein photoelectrons generated from both the emission layer and buffer layer are taken into account. By comparison of simulated results between the revised and conventional models, it is found that the electron contribution from the buffer layer to shortwave quantum efficiency is closely related to some factors, such as the thicknesses of emission layer and buffer layer and the interface recombination velocity. Besides, the experimental quantum efficiency data of reflection-mode and transmission-mode AlGaAs/GaAs photocathodes are well fitted to the revised models, which confirm the applicability of the revised quantum efficiency models. (C) 2015 AIP Publishing LLC.
引用
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页数:8
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