Sol-gel preparation of α-Fe2O3 thin films:: Structural characterization by XAFS and Raman

被引：72
|
作者：
Baratto, C
Lottici, PP
Bersani, D
Antonioli, G
Gnappi, G
Montenero, A
机构：
[1] INFM, I-43100 Parma, Italy
[2] Univ Parma, Dipartimento Fis, I-43100 Parma, Italy
[3] CORIVE, I-43100 Parma, Italy
[4] Univ Parma, Dipartimento Chim Gen & Inorgan Chim Analit, I-43100 Parma, Italy
来源：
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY | 1998年 / 13卷 / 1-3期
关键词：
Raman spectroscopy; XAFS; Fe2O3; thin films;
D O I：
10.1023/A:1008694519106
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Films of Fe2O3 have been prepared by two different sol-gel syntheses, starting from inorganic salts as precursors, Fe(NO3)(3).9H(2)O or FeCl3.6H(2)O. Differences in the local order between the two preparations are investigated by XAFS (X-Ray Absorption Fine Structure) and Raman measurements.
引用
收藏
页码：667 / 671
页数：5
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