Enhanced statistical detection of random telegraph noise in frequency and time domain

被引：5

作者：

Gauthier, Owen ^{[1
,2
]}

Haendler, Sebastien ^{[1
]}

Scheer, Patrick ^{[1
]}

Vernhet, Alexandre ^{[1
]}

Rafhay, Quentin ^{[2
]}

Theodorou, Christoforos ^{[2
]}

机构：

[1] STMicroelectronics, 850 Rue Jean Monnet, F-38920 Crolles, France

[2] Univ Savoie Mt Blanc, Univ Grenoble Alpes, CNRS, Grenoble INP,IMEP LAHC, F-38000 Grenoble, France

来源：

SOLID-STATE ELECTRONICS | 2022年 / 194卷

关键词：

Random telegraph noise; Lorentzian noise; Detection algorithm; Statistical analysis; CMOS transistor;

D O I：

10.1016/j.sse.2022.108320

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work, a new statistical detection method of Random Telegraph Noise (RTN) in the frequency domain is presented. An algorithm for the automated detection of Lorentzian spectra in the noise power spectral density (PSD) of a device is proposed, which enables the processing of a large amount of experimental data. Using 40 nm Bulk CMOS technology as a test vehicle, we demonstrate that the detection of Lorentzian spectra in the noise PSD allows an easier, faster, and often more precise detection of RTN presence compared to the time domain detection.

引用

页数：4

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