Exploring wear at the nanoscale with circular mode atomic force microscopy

被引：9

作者：

Noel, Olivier ^{[1
]}

Vencl, Aleksandar ^{[2
]}

Mazeran, Pierre-Emmanuel ^{[3
]}

机构：

[1] Le Mans Univ, IMMM, UMR 6283, CNRS, Av O Messiaen, F-72085 Le Mans 09, France

[2] Univ Belgrade, Fac Mech Engn, Kraljice Marije 16, Belgrade 11120 35, Serbia

[3] Univ Technol Compiegne, Sorbonne Univ, UMR 7337, CNRS,Ctr Rech Royallieu,CS 60 319, F-60203 Compiegne, France

来源：

BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 2017年 / 8卷

关键词：

circular mode atomic force microscopy; composite materials; image processing; nanowear; wear mechanisms; FRICTION;

D O I：

10.3762/bjnano.8.266

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al2O3 nanocomposite material used in industrial applications.

引用

页码：2662 / 2668

页数：7

共 50 条

[11] Polystyrene wear with atomic force microscopy (AFM)
Woodland, DD
Unertl, WN
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1996, 212 : 263 - POLY
[12] Effects of system parameters on tip-wear in tapping mode atomic force microscopy
Huang, Yen-Pu
Lin, Shih-Chieh
Lin, Victor Tzeng-Yow
[J]. SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES, 2013, 1 (01):
[13] Applications of Atomic Force Microscopy in Exploring Drug Actions in Lymphoma-Targeted Therapy at the Nanoscale
Li M.
Liu L.
Xi N.
Wang Y.
[J]. BioNanoScience, 2016, 6 (1) : 22 - 32
[14] Atomic force microscopy for nanoscale mechanical property characterization
Stan, Gheorghe
King, Sean W.
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2020, 38 (06):
[15] Nanoscale optical imaging by atomic force infrared microscopy
Rice, James H.
[J]. NANOSCALE, 2010, 2 (05) : 660 - 667
[16] Preventing Nanoscale Wear of Atomic Force Microscopy Tips Through the Use of Monolithic Ultrananocrystalline Diamond Probes
Liu, J.
Grierson, D. S.
Moldovan, N.
Notbohm, J.
Li, S.
Jaroenapibal, P.
O'Connor, S. D.
Sumant, A. V.
Neelakantan, N.
Carlisle, J. A.
Turner, K. T.
Carpick, R. W.
[J]. SMALL, 2010, 6 (10) : 1140 - 1149
[17] Study of a nanoscale water cluster by atomic force microscopy
Lee, Manhee
Sum, Baekman
Hashemi, N.
Jhe, Wonho
[J]. FARADAY DISCUSSIONS, 2009, 141 : 415 - 421
[18] VISUALIZATION OF NANOSCALE COMPONENTS USING ATOMIC FORCE MICROSCOPY
Qazi, Salahuddin
Decker, Robert C.
[J]. 2012 ASEE ANNUAL CONFERENCE, 2012,
[19] Nanoscale Electrowetting Effects Studied by Atomic Force Microscopy
Guan, Li
Qi, Guicun
Liu, Sheng
Zhang, Hui
Zhang, Zhong
Yang, Yanlian
Wang, Chen
[J]. JOURNAL OF PHYSICAL CHEMISTRY C, 2009, 113 (02): : 661 - 665
[20] Nanoscale ultrasonic subsurface imaging with atomic force microscopy
Ma, Chengfu
Arnold, Walter
[J]. JOURNAL OF APPLIED PHYSICS, 2020, 128 (18)

← 1 2 3 4 5 →