Processing of AlGaAs/GaAs quantum-cascade structures for terahertz laser

被引:5
|
作者
Szerling, Anna [1 ]
Kosiel, Kamil [1 ]
Szymanski, Michal [2 ]
Wasilewski, Zbig [3 ]
Golaszewska, Krystyna [1 ]
Laszcz, Adam [1 ]
Pluska, Mariusz [1 ]
Trajnerowicz, Artur [1 ]
Sakowicz, Maciej [1 ]
Walczakowski, Michal [4 ]
Palka, Norbert [4 ]
Jakiela, Rafal [5 ]
Piotrowska, Anna [1 ]
机构
[1] Inst Electr Mat Technol, PL-02668 Warsaw, Poland
[2] Warsaw Univ Life Sci, Fac Appl Informat & Math, PL-02776 Warsaw, Poland
[3] Univ Waterloo, Waterloo, ON N2L 3G1, Canada
[4] Mil Univ Technol, PL-00908 Warsaw, Poland
[5] PAS, Inst Phys, PL-02668 Warsaw, Poland
关键词
THz quantum-cascade lasers; m-m waveguides; metallic layers; MODE;
D O I
10.1117/1.JNP.9.093079
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report research results with regard to AlGaAs/GaAs structure processing for THz quantum-cascade lasers (QCLs). We focus on the processes of Ti/Au cladding fabrication for metal-metal waveguides and wafer bonding with indium solder. Particular emphasis is placed on optimization of technological parameters for the said processes that result in working devices. A wide range of technological parameters was studied using test structures and the analysis of their electrical, optical, chemical, and mechanical properties performed by electron microscopic techniques, energy dispersive x-ray spectrometry, secondary ion mass spectroscopy, atomic force microscopy, Fourier-transform infrared spectroscopy, and circular transmission line method. On that basis, a set of technological parameters was selected for the fabrication of devices lasing at a maximum temperature of 130 K from AlGaAs/GaAs structures grown by means of molecular beam epitaxy. Their resulting threshold-current densities were on a level of 1.5 kA/cm(2). Furthermore, initial stage research regarding fabrication of Cu-based claddings is reported as these are theoretically more promising than the Au-based ones with regard to low-loss waveguide fabrication for THz QCLs. (C) 2015 Society of Photo-Optical Instrumentation Engineers (SPIE)
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页数:17
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