Design and Fabrication of a Planar Three-DOFs MEMS-Based Manipulator

被引:23
|
作者
de Jong, Boudewijn R. [1 ]
Brouwer, Dannis M. [2 ]
de Boer, Meint J. [1 ]
Jansen, Henri V. [1 ]
Soemers, Herman M. J. R. [2 ,3 ]
Krijnen, Gijs J. M. [1 ]
机构
[1] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
[2] Univ Twente, Dept Mech Automat, NL-7500 AE Enschede, Netherlands
[3] Philips Appl Technol, Dept Mechatron, NL-5656 AE Eindhoven, Netherlands
关键词
Compliant mechanism; electrostatic actuators; exact constraint design; multidegrees of freedom; nanometer positioning; precision engineering; trench isolation; SILICON; RATIO;
D O I
10.1109/JMEMS.2010.2067196
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents the design, modeling, and fabrication of a planar three-degrees-of-freedom parallel kinematic manipulator, fabricated with a simple two-mask process in conventional highly doped single-crystalline silicon (SCS) wafers < 100 >. The manipulator's purpose is to provide accurate and stable positioning of a small sample (10 x 20 x 0.2 mu m(3)), e. g., within a transmission electron microscope. The manipulator design is based on the principles of exact constraint design, resulting in a high actuation-compliance combined with a relatively high suspension stiffness. A modal analysis shows that the fourth vibration mode frequency is at least a factor 11 higher than the first three actuation-related mode frequencies. The comb-drive actuators are modeled in combination with the shuttle suspensions gaining insight into the side and rotational pull-in stability conditions. The two-mask fabrication process enables high-aspect-ratio structures, combined with electrical trench insulation. Trench insulation allows structures in conventional wafers to be mechanically connected while being electrically insulated from each other. Device characterization shows high linearity of displacement wrt voltage squared over +/- 10 mu m stroke in the x- and y-directions and +/- 2 degrees rotation at a maximum of 50 V driving voltage. Out-of-plane displacement crosstalk due to in-plane actuation in resonance is measured to be less than 20 pm. The hysteresis in SCS, measured using white light interferometry, is shown to be extremely small.
引用
收藏
页码:1116 / 1130
页数:15
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