Practical solutions for scan design

被引：0
|
作者：
Zhang, L
He, XQ
机构：
来源：
1996 2ND INTERNATIONAL CONFERENCE ON ASIC, PROCEEDINGS | 1996年
关键词：
scan path; multi-path design; single path design; clock-tree;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper discusses structure of system clocks in circuits, and points out effective methods for scan design. Using these methods we can easily achieve testable design for synchronistic circuits.
引用
收藏
页码：384 / 387
页数：4
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