Non-probabilistic structural reliability model based on ellipsoidal-bound model with restricted expansion

被引：0
|
作者：
Li, Kunfeng [1 ]
Yang, Zichun [1 ]
Liu, Guifeng [1 ]
机构：
[1] Naval Univ Engn, Coll Naval Architecture & Power, Wuhan 430033, Peoples R China
来源：
FRONTIERS OF MANUFACTURING SCIENCE AND MEASURING TECHNOLOGY, PTS 1-3 | 2011年 / 230-232卷
关键词：
non-probabilistic reliability; ellipsoidal-bound model; reliability index; info-gap model; INFORMATION-GAP UNCERTAINTY;
D O I：
10.4028/www.scientific.net/AMR.230-232.920
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
When insufficient data are available, probabilistic reliability method is invalid, but the non-probabilistic reliability method based on I-G (information-gap) model is a valid alternative. The most common I-G model, ellipsoidal-bound model, has been updated in this paper by acquiring information about span restrictions of uncertainty quantities and a corresponding non-probabilistic reliability index was proposed. The method for computing the reliability index was also given. The new model can reveal the influence of the span restriction of uncertainty quantities on structural reliability.
引用
收藏
页码：920 / 924
页数：5
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