Simultaneous measurement of in-plane and out-of-plane displacement derivatives using dual-wavelength digital holographic interferometry

被引:20
|
作者
Rajshekhar, Gannavarpu [1 ]
Gorthi, Sai Siva [1 ,2 ]
Rastogi, Pramod [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Appl Comp & Mech Lab, CH-1015 Lausanne, Switzerland
[2] Harvard Univ, Rowland Inst, Cambridge, MA 02142 USA
关键词
3-DIMENSIONAL DISPLACEMENT; STRAIN;
D O I
10.1364/AO.50.000H16
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The paper introduces a method for simultaneously measuring the in-plane and out-of-plane displacement derivatives of a deformed object in digital holographic interferometry. In the proposed method, lasers of different wavelengths are used to simultaneously illuminate the object along various directions such that a unique wavelength is used for a given direction. The holograms formed by multiple reference-object beam pairs of different wavelengths are recorded by a 3-color CCD camera with red, green, and blue channels. Each channel stores the hologram related to the corresponding wavelength and hence for the specific direction. The complex reconstructed interference field is obtained for each wavelength by numerical reconstruction and digital processing of the recorded holograms before and after deformation. Subsequently, the phase derivative is estimated for a given wavelength using two-dimensional pseudo Wigner-Ville distribution and the in-plane and out-of-plane components are obtained from the estimated phase derivatives using the sensitivity vectors of the optical configuration. (C) 2011 Optical Society of America
引用
收藏
页码:H16 / H21
页数:6
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