Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives

被引:3
|
作者
Wu Minyang [1 ]
Ma Yinhang [1 ]
Cheng Hao [2 ]
Yang Fujun [1 ]
机构
[1] Southeast Univ, Jiangsu Key Lab Engn Mech, Nanjing 211189, Jiangsu, Peoples R China
[2] Beijing Inst Struct & Environm Engn, Sci & Technol Reliabil & Environm Engn Lab, Beijing 100076, Peoples R China
关键词
measurement; dual-wavelength shearography; measurement of displacement derivative; 3-chip color camera;
D O I
10.3788/AOS202040.1812002
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A color-camera-based shearography system using dual-wavelength lasers was developed for simultaneously measuring the in-plane and out-of-plane displacement derivatives of a deformed object. Lasers of dual wavelengths arc arranged to symmetrically and simultaneously illuminate on the object with identical angles of incidence. A set of phase-shifter and a modified Michelson interferometer arc used to build a temporal-phase-shift dual-wavelength shearography. The interferograms formed by the two wavelength arc recorded by one 3-chip color camera with green and blue channels. The phases related to the in-plane and out-of-plane components arc extracted from the shcarograms by using Carra algorithm. Experiment on a cantilevered aluminum beam deformation was performed to verify the feasibility and the capability of the testing system.
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页数:6
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