Photothermal Signal and Surface Potential around Grain Boundaries in Multicrystalline Silicon Solar Cells Investigated by Scanning Probe Microscopy

被引:12
|
作者
Hara, Kenji [1 ]
Takahashi, Takuji [1 ,2 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
[2] Univ Tokyo, Inst Nano Quantum Informat Elect, Meguro Ku, Tokyo 1538505, Japan
基金
日本学术振兴会;
关键词
POLYCRYSTALLINE SILICON; FORCE MICROSCOPY; PHOTOLUMINESCENCE; RECOMBINATION; WAFERS;
D O I
10.1143/APEX.5.022301
中图分类号
O59 [应用物理学];
学科分类号
摘要
The nonradiative recombination property of photocarriers is investigated around grain boundaries (GBs) in multicrystalline Si solar cells via local measurements of the photothermal (PT) signal using a dual sampling method in atomic force microscopy. An enhancement of the PT signal was observed around some specific GBs, where a change in the surface potential was also observed by Kelvin probe force microscopy. We therefore deduce that impurity segregation occurs in those areas, and that the PT signal enhancement and surface potential change are respectively attributable to the enhancement of carrier recombination by those impurity levels and the ionization of impurities. (C) 2012 The Japan Society of Applied Physics
引用
收藏
页数:3
相关论文
共 35 条
  • [1] Metal fingers on grain boundaries in multicrystalline silicon solar cells
    Ebner, R
    Radike, M
    Schlosser, V
    Summhammer, J
    [J]. PROGRESS IN PHOTOVOLTAICS, 2003, 11 (01): : 1 - 13
  • [2] Surface potential and surface photovoltage of oxide and nitride coated multicrystalline silicon solar cells using a scanning Kelvin probe
    Baikie, ID
    [J]. AMORPHOUS AND NANOCRYSTALLINE SILICON SCIENCE AND TECHNOLOGY- 2004, 2004, 808 : 629 - 634
  • [3] DIFFUSED JUNCTIONS IN MULTICRYSTALLINE SILICON SOLAR CELLS STUDIED BY COMPLEMENTARY SCANNING PROBE MICROSCOPY AND SCANNING ELECTRON MICROSCOPY TECHNIQUES
    Heath, Jennifer T.
    Jiang, Chun-Sheng
    Al-Jassim, Mowafak M.
    [J]. 35TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, 2010,
  • [4] Surface potential and surface photovoltage of oxide and nitride coated multicrystalline silicon solar cells using a scanning Kelvin probe
    Forsyth, G
    Baikie, L
    van der Heide, A
    [J]. MICROSCOPY OF SEMICONDUCTING MATERIALS 2003, 2003, (180): : 513 - 518
  • [5] PHOTOTHERMAL CHARACTERRIZATION BY ATOMIC FORCE MICROSCOPY AROUND GRAIN BOUNDARY IN MULTICRYSTALLINE SILICON MATERIAL
    Hara, Kenji
    Takahashi, Takuji
    [J]. 35TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, 2010, : 1387 - 1389
  • [6] Potential variation around grain boundaries in BaSi2 films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy
    Baba, Masakazu
    Hara, Kosuke O.
    Tsukahara, Daichi
    Toko, Kaoru
    Usami, Noritaka
    Sekiguchi, Takashi
    Suemasu, Takashi
    [J]. JOURNAL OF APPLIED PHYSICS, 2014, 116 (23)
  • [7] Understanding the Role of Grain Boundaries in Sulfide Thin Film Solar Cells with Scanning Probe Microscopy
    Li, Joel B.
    Chawla, Vardaan
    Clemens, Bruce M.
    [J]. 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2012,
  • [8] Investigation of charge trapping at grain boundaries in polycrystalline and multicrystalline silicon solar cells
    Heath, Jennifer T.
    Jiang, Chun-Sheng
    Moutinho, Helio R.
    Al-Jassim, Mowafak M.
    [J]. DEFECTS IN INORGANIC PHOTOVOLTAIC MATERIALS, 2010, 1268 : 24 - 29
  • [9] Two-dimensional junction identification in multicrystalline silicon solar cells by scanning Kelvin probe force microscopy
    Jiang, C.-S.
    Moutinho, H. R.
    Reedy, R.
    Al-Jassim, M. M.
    Blosse, A.
    [J]. JOURNAL OF APPLIED PHYSICS, 2008, 104 (10)
  • [10] Polarized photoluminescence imaging analysis around small-angle grain boundaries in multicrystalline silicon wafers for solar cells
    Kato, Gen
    Tajima, Michio
    Toyota, Hiroyuki
    Ogura, Atsushi
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2014, 53 (08)