High-Energy Synchrotron X-Ray Diffraction for In Situ Diffuse Scattering Studies of Bulk Single Crystals

被引：19
|
作者：
Daniels, John E. [1 ]
Jo, Wook [2 ]
Donner, Wolfgang [2 ]
机构：
[1] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
[2] Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany
来源：
JOM | 2012年 / 64卷 / 01期
关键词：
Bragg Peak; Reciprocal Space; Diffuse Scattering; Superlattice Reflection; Dielectric Breakdown Strength;
D O I：
10.1007/s11837-011-0230-z
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
High-energy synchrotron x-ray scattering offers a powerful technique for investigation of single-crystal material structures. Large, mm-sized crystals can be used, allowing complex in situ sample environments to be employed. Here, we demonstrate how this technique can be applied for the collection of single-crystal diffuse scattering volumes from the electro-active material 96%Bi0.5Na0.5TiO3-4%BaTiO3 while electric fields are applied in situ. The data obtained allow correlation of the atomic and nanoscale structures with the observed macroscopic electro-active properties of interest. This article presents a recent study relating the nanoscale stacking fault structure in BNT-BT to the relaxor-ferroelectric nature of the material [Daniels et al. in Appl. Phys. Lett. 98, 252904 (2011)], and extends this study with further experimental description and analysis.
引用
收藏
页码：174 / 180
页数：7
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