A comparative study of pseudo stuck-at and leakage fault model

被引：1
|
作者：
Zachariah, ST [1 ]
Chakravarty, S [1 ]
机构：
[1] SUNY Buffalo, Dept Comp Engn & Sci, Buffalo, NY 14260 USA
来源：
TWELFTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS | 1999年
关键词：
D O I：
10.1109/ICVD.1999.745130
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I-DDQ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.
引用
收藏
页码：91 / 94
页数：4
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