Increased metal-insulator transition temperatures in epitaxial thin films of V2O3 prepared in reduced oxygen environments

被引:42
|
作者
Brockman, J. [1 ,2 ]
Aetukuri, N. P. [1 ,3 ]
Topuria, T. [1 ]
Samant, M. G. [1 ]
Roche, K. P. [1 ]
Parkin, S. S. P. [1 ]
机构
[1] IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
[3] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
关键词
ELECTRONIC-PROPERTIES; DEPOSITION; SYSTEM; PHASE;
D O I
10.1063/1.3574910
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thin films of V2O3 were grown epitaxially on c-plane sapphire substrates by oxygen plasma-assisted thermal evaporation. Reducing the amount of oxygen supplied during growth led to a nearly 50 K increase in V2O3's metal-insulator transition temperature to a temperature as high as 184 K. By systematically varying the oxygen pressure the transition temperature monotonically increased, which was accompanied by a concomitant increase in the room-temperature resistivity. These trends are consistent with a continuous change in the stoichiometry of V2O3. (C) 2011 American Institute of Physics. [doi:10.1063/1.3574910]
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页数:3
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