Increased metal-insulator transition temperatures in epitaxial thin films of V2O3 prepared in reduced oxygen environments
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作者:
Brockman, J.
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IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USAIBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Brockman, J.
[1
,2
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Aetukuri, N. P.
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IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Aetukuri, N. P.
[1
,3
]
Topuria, T.
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IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USAIBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Topuria, T.
[1
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Samant, M. G.
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IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USAIBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Samant, M. G.
[1
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Roche, K. P.
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IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USAIBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Roche, K. P.
[1
]
Parkin, S. S. P.
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IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USAIBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
Parkin, S. S. P.
[1
]
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[1] IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
[3] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
Thin films of V2O3 were grown epitaxially on c-plane sapphire substrates by oxygen plasma-assisted thermal evaporation. Reducing the amount of oxygen supplied during growth led to a nearly 50 K increase in V2O3's metal-insulator transition temperature to a temperature as high as 184 K. By systematically varying the oxygen pressure the transition temperature monotonically increased, which was accompanied by a concomitant increase in the room-temperature resistivity. These trends are consistent with a continuous change in the stoichiometry of V2O3. (C) 2011 American Institute of Physics. [doi:10.1063/1.3574910]
机构:
Univ Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, JapanUniv Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, Japan
Yonezawa, S
Muraoka, Y
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Univ Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, JapanUniv Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, Japan
Muraoka, Y
Ueda, Y
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Univ Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, JapanUniv Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, Japan
Ueda, Y
Hiroi, Z
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Univ Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, JapanUniv Tokyo, Inst Solid State Phys, Mat Design & Characterizat Lab, Kashiwa, Chiba 2778581, Japan