Increased metal-insulator transition temperatures in epitaxial thin films of V2O3 prepared in reduced oxygen environments

被引:42
|
作者
Brockman, J. [1 ,2 ]
Aetukuri, N. P. [1 ,3 ]
Topuria, T. [1 ]
Samant, M. G. [1 ]
Roche, K. P. [1 ]
Parkin, S. S. P. [1 ]
机构
[1] IBM Res Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
[3] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
关键词
ELECTRONIC-PROPERTIES; DEPOSITION; SYSTEM; PHASE;
D O I
10.1063/1.3574910
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thin films of V2O3 were grown epitaxially on c-plane sapphire substrates by oxygen plasma-assisted thermal evaporation. Reducing the amount of oxygen supplied during growth led to a nearly 50 K increase in V2O3's metal-insulator transition temperature to a temperature as high as 184 K. By systematically varying the oxygen pressure the transition temperature monotonically increased, which was accompanied by a concomitant increase in the room-temperature resistivity. These trends are consistent with a continuous change in the stoichiometry of V2O3. (C) 2011 American Institute of Physics. [doi:10.1063/1.3574910]
引用
收藏
页数:3
相关论文
共 50 条
  • [1] Epitaxial strain effects on the metal-insulator transition in V2O3 thin films
    Yonezawa, S
    Muraoka, Y
    Ueda, Y
    Hiroi, Z
    SOLID STATE COMMUNICATIONS, 2004, 129 (04) : 245 - 248
  • [2] Tuning metal-insulator transitions in epitaxial V2O3 thin films
    Thorsteinsson, Einar B.
    Shayestehaminzadeh, Seyedmohammad
    Arnalds, Unnar B.
    APPLIED PHYSICS LETTERS, 2018, 112 (16)
  • [3] Metal-insulator phase transition in hydrogenated thin films of V2O3
    Andreev, V. N.
    Klimov, V. A.
    Kompan, M. E.
    PHYSICS OF THE SOLID STATE, 2017, 59 (12) : 2441 - 2443
  • [4] Evidence of the metal-insulator transition in ultrathin unstrained V2O3 thin films
    Dillemans, L.
    Smets, T.
    Lieten, R. R.
    Menghini, M.
    Su, C-Y
    Locquet, J-P
    APPLIED PHYSICS LETTERS, 2014, 104 (07)
  • [5] The metal-insulator transition in V2O3(0001) thin films:: surface termination effects
    Pfuner, F
    Schoiswohl, J
    Sock, M
    Surnev, S
    Ramsey, MG
    Netzer, FP
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2005, 17 (26) : 4035 - 4047
  • [6] Confinement-Induced Isosymmetric Metal-Insulator Transition in Ultrathin Epitaxial V2O3 Films
    Mellaerts, Simon
    Bellani, Claudio
    Hsu, Wei-Fan
    Binetti, Alberto
    Schouteden, Koen
    Recaman-Payo, Maria
    Menghini, Mariela
    Rubio-Zuazo, Juan
    Lopez-Sanchez, Jesus
    Seo, Jin Won
    Houssa, Michel
    Locquet, Jean-Pierre
    ACS APPLIED MATERIALS & INTERFACES, 2024, 16 (18) : 23476 - 23483
  • [7] Correlation between strain and the metal-insulator transition in epitaxial V2O3 thin films grown by Molecular Beam Epitaxy
    Dillemans, L.
    Lieten, R. R.
    Menghini, M.
    Smets, T.
    Seo, J. W.
    Locquet, J. -P.
    THIN SOLID FILMS, 2012, 520 (14) : 4730 - 4733
  • [8] Reversible control of the metal-insulator transition in V2O3 thin films through plasma hydrogenation
    Sultan, M. T.
    Arnalds, U. B.
    PHYSICA SCRIPTA, 2022, 97 (03)
  • [9] Effect of growth conditions and buffer layers on the metal-insulator transition in V2O3 thin films
    Schuler, H
    Weissmann, G
    Renner, C
    Six, S
    Klimm, S
    Simmet, F
    Horn, S
    EPITAXIAL OXIDE THIN FILMS II, 1996, 401 : 61 - 66