High-Speed Optical Beam Scanning Using KTN Crystal

被引:0
|
作者
Sakamoto, Takashi [1 ]
Toyoda, Seiji [1 ]
Ueno, Masahiro [1 ]
Kobayashi, Junya [1 ]
机构
[1] NTT Corp, NTT Device Innovat Ctr, Atsugi, Kanagawa, Japan
关键词
deflector; electrooptic effect; Kerr effect; space charge;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
500 kHz optical beam scanning with a full scan angle of over 100 mrad is demonstrated using a potassium tantalite niobate (KTa1-xNbxO3, KTN) deflector. To suppress any heating of the KTN chips during the high frequency operation and to have a sufficient interaction length to achieve more than 100 mrad deflection, the deflector consists of two KTN chips each of which has a pentagon-shaped electrode surface whose longest side is shortened to 1.5 mm. The full scan angle of the deflector is measured and the KTN temperature dependence of the permittivity accounts for the voltage and frequency dependence of the scan angle.
引用
收藏
页码:173 / 176
页数:4
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