High-resolution KTN optical beam scanner

被引：0

作者：

Naganuma, Kazunori ^{[1
,2
]}

Miyazu, Jun ^{[1
]}

Yagi, Shogo ^{[1
]}

机构：

[1] Advanced Opto-Electronics Laboratory, NTT Photonics Laboratories, Japan

[2] NTT Photonics Laboratories, Atsugi-shi, 243-0198, Japan

来源：

NTT Technical Review | 2009年 / 7卷 / 12期

关键词：

Crystal homogeneity - High resolution - Multi-pass - Optical beam scanner - Scanning resolution;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

KTa1-xNbxO3 (KTN) enables us to construct compact, fast optical beam scanners based on a new principle unique to KTN. In this article, we clarify the factors determining the scanning resolution and describe a multipass scheme that is effective for increasing the resolution achievable with the existing degree of crystal homogeneity. The resulting improvements in resolution will make KTN scanners applicable to a broader industrial arena.

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