High-resolution KTN optical beam scanner

被引：0
|
作者：
Naganuma, Kazunori [1 ,2 ]
Miyazu, Jun [1 ]
Yagi, Shogo [1 ]
机构：
[1] Advanced Opto-Electronics Laboratory, NTT Photonics Laboratories, Japan
[2] NTT Photonics Laboratories, Atsugi-shi, 243-0198, Japan
来源：
NTT Technical Review | 2009年 / 7卷 / 12期
关键词：
Crystal homogeneity - High resolution - Multi-pass - Optical beam scanner - Scanning resolution;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
KTa1-xNbxO3 (KTN) enables us to construct compact, fast optical beam scanners based on a new principle unique to KTN. In this article, we clarify the factors determining the scanning resolution and describe a multipass scheme that is effective for increasing the resolution achievable with the existing degree of crystal homogeneity. The resulting improvements in resolution will make KTN scanners applicable to a broader industrial arena.
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