Aperiodic normal-incidence antimony-based multilayer mirrors in the 8-13-nm spectral range

被引:4
|
作者
Vishnyakov, E. A. [1 ,2 ]
Luginin, M. S. [1 ,2 ]
Pirozhkov, A. S. [1 ,2 ]
Ragozin, E. N. [1 ,2 ]
Startsev, S. A. [1 ,2 ]
机构
[1] Russian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia
[2] Moscow Inst Phys & Technol, Dolgoprudnyi 141700, Moscow Region, Russia
关键词
soft X-ray range; antimony-based multilayer mirrors; aperiodic structures; normal incidence of radiation; X-RAY PULSES; REFLECTION;
D O I
10.1070/QE2011v041n01ABEH014383
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The optical properties of several materials were analysed from the standpoint of fabrication of broadband normal-incidence multilayer mirrors possessing maximal uniform reflectivity in the 8 - 13-nm range. By solving the inverse problem of multilayer optics we show that aperiodic Sb/(B4C,Sc,Si) multilayer structures optimised for maximum uniform reflectivity in the 8 - 13-nm range are able to afford a normal-incidence reflectivity R similar to 10% throughout this range. The best results are exhibited by the pair Sb/B4C, for which the average reflection coefficient amounts to about 13%. The dependence of optimisation result on the program-mable limitation on the minimal layer thickness in the multilayer structure was numerically investigated. An empirical rule was established where by setting the lower bound for a layer thickness at a level similar to lambda(min)/4 (in this case, lambda(min) = 8 nm) does not result in an appreciable lowering of attainable uniform reflectivity.
引用
收藏
页码:75 / 80
页数:6
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