X-ray reflectivity and polarized neutron reflectivity investigations of [Co60Fe60B20/MgO]n multilayers

被引：0
|
作者：
Vadala, M. [1 ]
Wolff, M. [1 ]
Westerholt, K. [1 ]
Zabel, H. [1 ]
Wisniowski, P. [2 ]
Cardoso, S. [2 ]
机构：
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
[2] INESC Microsyst & Nanotechnol, P-1000029 Lisbon, Portugal
来源：
ACTA PHYSICA POLONICA A | 2007年 / 112卷 / 06期
关键词：
D O I：
10.12693/APhysPolA.112.1249
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
In recent years magnetic tunnel junctions have been intensively studied and incorporated in magnetic random access memory devices and magnetic sensors, where large tunnelling magnetoresistance ratios are preferred. The largest tunnelling magnetoresistance values until now have been observed in magnetic tunnel junctions with MgO barriers and CoFeB electrodes after annealing of the junction above the recrystallization temperature of the amorphous CoFeB layers. We used X-ray reflectivity and polarized neutron reflectivity to study [Co60Fe60B20/MgO](x14) multilayers with the MgO layers prepared by different methods and annealed at different temperatures in order to compare the interface quality and the structural changes induced upon annealing.
引用
收藏
页码：1249 / 1257
页数：9
相关论文
共 50 条
  • [31] Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films
    Lee, CH
    Yu, KL
    Huang, JCA
    Felcher, G
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1999, 60 (8-9) : 1491 - 1494
  • [32] Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films
    Dept. of Eng. and System Science, Also Nucl. Reactor Div., Nucl. S., Hsinchu, Taiwan
    不详
    不详
    J Phys Chem Solids, 8 (1491-1494):
  • [33] Structural and magnetic characterization of [Co2MnGe/MgO]n and [Co2MnGe/Al2O3]n multilayers by polarized neutron reflectivity
    Vadala, M.
    Lamperti, A.
    Wolff, M.
    Westerholt, K.
    Zabel, H.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2008, 20 (10)
  • [34] Hard and Soft X-Ray Reflectivity Studies of (NiFe/Au/Co/Au)10 Magnetic Multilayers
    Szymanski, B.
    Stobiecki, F.
    Weis, T.
    Engel, D.
    Urbaniak, M.
    Kuswik, P.
    Lengemann, D.
    Ehresmann, A.
    ACTA PHYSICA POLONICA A, 2009, 115 (01) : 366 - 368
  • [35] Specular and off-specular x-ray reflectivity study of ion irradiated Co/Pt multilayers
    Schug, C
    Grimm, H
    Berger, R
    Dietzel, A
    Wormington, M
    SURFACE AND INTERFACE ANALYSIS, 2004, 36 (08) : 908 - 911
  • [36] Applications of an energy-dispersive pnCCD for X-ray reflectivity: Investigation of interdiffusion in Fe-Pt multilayers
    Abboud, Ali
    Send, Sebastian
    Hartmann, Robert
    Strueder, Lothar
    Savan, Alan
    Ludwig, Alfred
    Zotov, Nikolay
    Pietsch, Ullrich
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2011, 208 (11): : 2601 - 2607
  • [37] STRUCTURAL CHARACTERIZATION OF AU/CO MULTILAYERS BY X-RAY-DIFFRACTION, X-RAY REFLECTIVITY AND GLANCING-INCIDENCE X-RAY-FLUORESCENCE
    VANDENHOOGENHOF, WW
    RYAN, TW
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1993, 121 (1-3) : 88 - 93
  • [38] Soft x-ray reflectivity and structure evaluation of Ni/Ti and Ni-N/Ti-N multilayers
    Takenaka, H
    Muramatsu, Y
    Hayashi, S
    Ito, H
    Ueno, Y
    Moriya, N
    Gullikson, EM
    Perera, RCC
    X-RAY MICROSCOPY, PROCEEDINGS, 2000, 507 : 714 - 717
  • [39] Chemical and magnetic structure of uranium/gadolinium multilayers studied by transmission electron microscopy, neutron scattering, and x-ray reflectivity
    Springell, R.
    Langridge, S.
    Wildes, A.
    Wilkins, S. B.
    Sanchez-Hanke, C.
    Moore, K. T.
    Butterfield, M. T.
    Chivall, J.
    Ward, R. C. C.
    Wells, M. R.
    Lander, G. H.
    PHYSICAL REVIEW B, 2010, 81 (13)
  • [40] Interface width evaluation in thin layered CoFeB/MgO multilayers including Ru or Ta buffer layer by X-ray reflectivity
    Lamperti, A.
    Ahn, S. -M.
    Ocker, B.
    Mantovan, R.
    Ravelosona, D.
    THIN SOLID FILMS, 2013, 533 : 79 - 82
12345