共 50 条
- [32] A roadmap for boundary-scan test reuse INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 340 - 346
- [33] The success story of boundary-scan testing 1600, Japan Institute of Electronics Packaging (23): : 287 - 291
- [35] The latest trend of the boundary-scan standard Journal of Japan Institute of Electronics Packaging, 2021, 24 (01): : 154 - 161
- [37] TEXAS INSTRUMENTS BOUNDARY-SCAN TESTING IEEE DESIGN & TEST OF COMPUTERS, 1991, 8 (01): : 96 - 97
- [38] Backplane interconnect test in a boundary-scan environment INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 717 - 724
- [40] Algorithms of inserting boundary-scan circuit automatically International Conference on Solid-State and Integrated Circuit Technology Proceedings, 1998, : 527 - 531