Standing wave reduction of positive and negative I-line resists.

被引:4
|
作者
Grandpierre, AG [1 ]
Schiwon, R [1 ]
Finger, F [1 ]
Schröder, UP [1 ]
机构
[1] Infineon Technol SC300 GmbH & Co OHG, D-01099 Dresden, Germany
关键词
I-line; standing waves; positive resist; negative amplified resist;
D O I
10.1117/12.596508
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Implantation layers may require smaller resist thickness as chip dimensions decrease. When reducing the thickness below 800 nm, while keeping all other track and exposure settings the same, standing waves in positive and negative I-line resists become more prominent. Bottom antireflective coating helps reducing the amplitude of the waves, but additional efforts, like BARC open RIE steps, or more coater units on the track, will increase the cost of ownership significantly. One may also consider changing the bake settings, which play a critical role in the formation of standing waves. The standard settings used for mid UV resists are 90 deg post apply bake (PAB) and 110 deg post exposure bake (PEB). Although resist suppliers recommend staying within this temperature range, we have used settings outside the range, as part of testing for possible profile ameliorations. Optimized settings for both tones were achieved with a different combination of the two bakes. The overall performances of the tested samples with optimized settings were satisfying in terms of CD range, stability and process window.
引用
收藏
页码:755 / 764
页数:10
相关论文
共 50 条
  • [21] Positive tone i-line photoresist with controlled undercut profile for advanced packaging
    Liu, Walter
    Chen, Chunwei
    Lu, Ping-Hung
    Lai, SookMee
    Sakurai, Yoshiharu
    ADVANCES IN PATTERNING MATERIALS AND PROCESSES XL, 2023, 12498
  • [22] High-contrast I-line positive photoresist for laser reticle writer
    Kobayashi, Y
    Oppata, Y
    Ezoe, Y
    Shigemitsu, F
    Urayama, K
    Doi, K
    PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY VII, 2000, 4066 : 289 - 294
  • [23] The Imaging Study of a Novel Photopolymer Used in I-line Negative-tone resist
    Liu Lu
    Zou Yingquan
    ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXVII, PTS 1 AND 2, 2010, 7639
  • [24] Chemically amplified, thick film, i-line positive resist for electroplating and redistribution applications
    Toukhy, Medhat
    Mullen, Salem
    Paunescu, Margareta
    Chen, Chunwei
    Meyer, Stephen
    Pawlowski, Georg
    Murakami, Yoshio
    Hamel, Clifford
    ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXIII, PTS 1 AND 2, 2006, 6153 : U1654 - U1661
  • [25] Chemically Amplified i-line Positive Resist for Next Generation Flat Panel Display
    Lee, Hsing-Chieh
    Lu, Ying-Hao
    Huang, Shin-Yih
    Lan, Wei-Jen
    Hanabata, Makoto
    ADVANCES IN PATTERNING MATERIALS AND PROCESSES XXXIV, 2017, 10146
  • [26] Novolak resin for ultra fast high resolution positive i-line photoresist compositions
    Rahman, MD
    Lu, PH
    Cook, MM
    Kim, WK
    Khanna, DN
    ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XV, PTS 1 AND 2, 1998, 3333 : 1189 - 1200
  • [27] Super-Resolution Critical Dimension Limits of Positive Tone i-line Photoresists
    Miller, David B.
    Jones, Adam M.
    McLeod, Robert R.
    ADVANCED FABRICATION TECHNOLOGIES FOR MICRO/NANO OPTICS AND PHOTONICS XI, 2018, 10544
  • [28] High resolution negative i-line resist and process for metal lift-off applications
    Toukhy, M
    Mullen, S
    Lu, PH
    Neisser, M
    ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XIX, PTS 1 AND 2, 2002, 4690 : 846 - 853
  • [29] BISAZIDOBIPHENYLS NOVOLAK RESIN NEGATIVE RESIST SYSTEMS FOR I-LINE PHASE-SHIFTING LITHOGRAPHY
    HATTORI, KT
    HATTORI, T
    UCHINO, S
    UENO, T
    HAYASHI, N
    SHIRAI, S
    MORIUCHI, N
    MORITA, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12B): : 4307 - 4311
  • [30] The synthesis of novel ester acetal polymers and their application for chemically amplified positive i-line photoresist
    Wang, Liyuan
    Huo, Yongen
    Kong, Fanrong
    ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXV, PTS 1 AND 2, 2008, 6923