Analysis of fresco paintings by X-ray fluorescence method

被引：14
|
作者：
Cechák, T
Gerndt, J
Musílek, L
Kopecká, I
机构：
[1] Czech Tech Univ, Fac Nucl Sci & Phys Engn, Prague 11519 1, Czech Republic
[2] State Inst Preservat Histor Monuments, Prague 11000 1, Czech Republic
来源：
RADIATION PHYSICS AND CHEMISTRY | 2001年 / 61卷 / 3-6期
关键词：
X-ray fluorescence analysis; fresco paintings; Si(Li) detector;
D O I：
10.1016/S0969-806X(01)00385-1
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
An XRF technique was used for the analysis of fresco paintings. The analysis of paintings makes it possible to examine pigmented materials. An application of the method is used to illustrate the technique. (C) 2001 Elsevier Science Ltd. All rights reserved.
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页码：717 / 719
页数：3
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