BIST analyzer: a training platform for SoC testing

被引：0

作者：

Jutman, A. ^{[1
]}

Tsertov, A. ^{[1
]}

Tsepurov, A. ^{[1
]}

Aleksejev, I. ^{[1
]}

Ubar, R. ^{[1
]}

Wuttke, H. -D. ^{[2
]}

机构：

[1] Tallinn Univ Technol, Dept Comp Engn, EE-12618 Tallinn, Estonia

[2] Tech Univ Ilmenau, Fac Informat & Automat, D-98684 Ilmenau, Germany

来源：

2007 37TH ANNUAL FRONTIERS IN EDUCATION CONFERENCE, GLOBAL ENGINEERING : KNOWLEDGE WITHOUT BORDERS - OPPORTUNITIES WITHOUT PASSPORTS, VOLS 1- 4 | 2007年

关键词：

courses on electronic testing and design; training and research tool; web-based training; !text type='Java']Java[!/text] platform;

D O I：

暂无

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

Linear Feedback Shift Registers (LFSR) and other Pseudo-Random Pattern Generators (PRPG) have become one of the central elements used in testing and self testing of contemporary complex electronic systems like processors, controllers, and high-performance integrated circuits. The current paper describes :a training and research tool for learning basic and advanced issues related to PRPG-based test pattern generation. Unlike other similar systems, this tool facilitates study of various test optimization problems, allows fault coverage analysis for different circuits and with different LFSR:parameters. The main didactic aim of the tool is presenting complicated concepts in a comprehensive graphical and analytical way. The multi-platform JAVA runtime environment allows for easy access and usage of the tool both in a classroom and at home. The BIST Analyzer represents an integrated simulation, training, band research environment that supports both analytic and synthetic way of learning. Due to the above mentioned facts the tool provides a unique training platform to use in courses on electronic testing and design for testability. The BIST Analyzer has got a positive feedback from students of Darmstadt TU (Germany) and Tallinn TU (Estonia).

引用

页码：1534 / +

页数：2

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