Multiple fault diagnosis in analogue circuits using time domain response features and multilayer perceptrons

被引：9
|
作者：
Ogg, S
Lesage, S
Jervis, BW
Maidon, Y
Zimmer, T
机构：
[1] Sheffield Hallam Univ, Sch Engn, Sheffield S1 1WB, S Yorkshire, England
[2] Univ Bordeaux 1, Microelect Lab, IXL, F-33405 Talence, France
来源：
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS | 1998年 / 145卷 / 04期
关键词：
integrated circuits; artificial neural networks; multilayer perceptrons; fault diagnosis;
D O I：
10.1049/ip-cds:19982119
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A technique is described for diagnosing multiple faults in analogue circuits from their impulse response function using multilayer perceptrons, in terms of a specific example. A Dirac impulse input to the circuit was simulated, and time domain features of the output response were classified by a system of two multilayer perceptrons to produce accurate numerical fault values.
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页码：213 / 218
页数：6
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