In Situ Observation of Dark Current Emission in a High Gradient rf Photocathode Gun

被引：13

作者：

Shao, Jiahang ^{[1
,2
]}

Shi, Jiaru ^{[1
]}

Antipov, Sergey P. ^{[2
,3
]}

Baryshev, Sergey V. ^{[2
,3
]}

Chen, Huaibi ^{[1
]}

Conde, Manoel ^{[2
]}

Gai, Wei ^{[2
]}

Ha, Gwanghui ^{[2
]}

Jing, Chunguang ^{[2
,3
]}

Wang, Faya ^{[4
]}

Wisniewski, Eric ^{[2
]}

机构：

[1] Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China

[2] Argonne Natl Lab, Lemont, IL 60439 USA

[3] Euclid Techlabs LLC, Bolingbrook, IL 60440 USA

[4] SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA

来源：

PHYSICAL REVIEW LETTERS | 2016年 / 117卷 / 08期

基金：

中国国家自然科学基金;

关键词：

FIELD-EMISSION; ELECTRON-EMISSION;

D O I：

10.1103/PhysRevLett.117.084801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Undesirable electron field emission (also known as dark current) in high gradient rf photocathode guns deteriorates the quality of the photoemission current and limits the operational gradient. To improve the understanding of dark current emission, a high-resolution (similar to 100 mu m) dark current imaging experiment has been performed in an L-band photocathode gun operating at similar to 100 MV/m of surface gradient. Scattered strong emission areas with high current have been observed on the cathode. The field enhancement factor beta of selected regions on the cathode has been measured. The postexaminations with scanning electron microscopy and white light interferometry reveal the origins of similar to 75% strong emission areas overlap with the spots where rf breakdown has occurred.

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页数：5

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