Attosecond metrology comes of age

被引:8
|
作者
Kienberger, Reinhard [1 ]
Krausz, Ferenc [1 ,2 ]
机构
[1] Vienna Univ Technol, Inst Photon, A-1040 Vienna, Austria
[2] Max Planck Inst Quantum Opt, D-85748 Garching, Germany
关键词
D O I
10.1238/Physica.Topical.110a00032
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Atoms exposed to a few oscillation cycles of intense visible or near-infrared light are able to emit a single X-ray burst of sub-femtosecond duration (1 fs = 10(-15) s). Precise temporal control of this energetic photon emission can be achieved by full control of the hyperfast field oscillations in the laser pulses driving the emission process. Sub-femtosecond X-ray pulses along with intense, synchronized, waveform-controlled few-cycle laser pulses led to the development of a new measuring apparatus, which has been dubbed a light-field-controlled streak camera. It measures the time-momentum distribution of electrons ejected from atoms following an impulsive excitation by a sub-femtosecond X-ray pulse. From the time-momentum distribution of ejected primary (photo) and secondary (Auger) electrons the excitation dynamics (i.e. characteristics of the exciting X-ray pulse) and the subsequent relaxation of the electron shell of the excited atom, respectively, can be inferred, currently with a resolution of similar to 100 attoseconds (1 as = 10(-18) s). The techniques reviewed in this paper offer the potential for advancing time-domain metrology towards the atomic unit of time (24 as).
引用
收藏
页码:32 / 38
页数:7
相关论文
共 50 条
  • [21] Recent developments in attosecond pulse train metrology
    Charalambidis, D
    Papadogiannis, NA
    Tzallas, P
    Tsakiris, GD
    Witte, K
    PHYSICA SCRIPTA, 2003, T105 : 23 - 26
  • [22] Attosecond physics comes of age: from tracing to steering electrons at sub-atomic scales
    Kienberger, R.
    Uiberacker, M.
    Kling, M. F.
    Krausz, F.
    JOURNAL OF MODERN OPTICS, 2007, 54 (13-15) : 1985 - 1998
  • [23] Extending optical fs metrology to XUV attosecond pulses
    P. Tzallas
    K. Witte
    G.D. Tsakiris
    N.A. Papadogiannis
    D. Charalambidis
    Applied Physics A, 2004, 79 : 1673 - 1677
  • [24] Attosecond pulse trains: Generation, metrology, and application perspectives
    Tzallas, P
    Benis, EP
    Charalambidis, D
    Tsakiris, GD
    Witte, K
    Nikolopoulos, LAA
    LASER PHYSICS, 2005, 15 (06) : 821 - 831
  • [25] Attosecond metrology at seeded free-electron lasers
    Sansone, Giuseppe
    2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2021,
  • [26] Atomic partial wave meter by attosecond coincidence metrology
    Wenyu Jiang
    Gregory S. J. Armstrong
    Jihong Tong
    Yidan Xu
    Zitan Zuo
    Junjie Qiang
    Peifen Lu
    Daniel D. A. Clarke
    Jakub Benda
    Avner Fleischer
    Hongcheng Ni
    Kiyoshi Ueda
    Hugo W. van der Hart
    Andrew C. Brown
    Xiaochun Gong
    Jian Wu
    Nature Communications, 13
  • [27] Atomic partial wave meter by attosecond coincidence metrology
    Jiang, Wenyu
    Armstrong, Gregory S. J.
    Tong, Jihong
    Xu, Yidan
    Zuo, Zitan
    Qiang, Junjie
    Lu, Peifen
    Clarke, Daniel D. A.
    Benda, Jakub
    Fleischer, Avner
    Ni, Hongcheng
    Ueda, Kiyoshi
    van der Hart, Hugo W.
    Brown, Andrew C.
    Gong, Xiaochun
    Wu, Jian
    NATURE COMMUNICATIONS, 2022, 13 (01)
  • [28] Attosecond metrology in the few-optical-cycle regime
    Sansone, G.
    Benedetti, E.
    Vozzi, C.
    Stagira, S.
    Nisoli, M.
    NEW JOURNAL OF PHYSICS, 2008, 10
  • [29] Extending fs pulse metrology to attosecond XUV pulses
    Tzallas, P
    Tsakiris, GD
    Witte, K
    Nikolopoulos, LAA
    Benis, EP
    Kovacev, M
    Charalambidis, D
    HIGH-POWER LASER ABLATION V, PTS 1 AND 2, 2004, 5448 : 538 - 549
  • [30] Extending optical fs metrology to XUV attosecond pulses
    Tzallas, P
    Witte, K
    Tsakiris, GD
    Papadogiannis, NA
    Charalambidis, D
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2004, 79 (07): : 1673 - 1677