Towards imaging with polycrystalline mercuric iodide semiconductor detectors

被引:20
|
作者
Schieber, M [1 ]
Zuck, A [1 ]
Braiman, M [1 ]
Melekhov, L [1 ]
Nissenbaum, J [1 ]
Turchetta, R [1 ]
Dulinski, W [1 ]
Husson, D [1 ]
Riester, JL [1 ]
Schlesinger, TE [1 ]
Toney, J [1 ]
Sanguinetti, S [1 ]
Montalti, M [1 ]
Guzzi, M [1 ]
机构
[1] Hebrew Univ Jerusalem, IL-91904 Jerusalem, Israel
关键词
D O I
10.1557/PROC-487-329
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Preparation of polycrystalline mercuric iodide very thin (1 mu m) films using laser ablation and thick films (100-600 mu m), using hot pressing, hot wall vapor deposition and screen printing methods, fabricated as radiation detector plates are briefly described. X-ray diffraction, photoluminescence and optical microscopic measurements as well as response to nuclear radiation will be given. Finally, recent results obtained with a large area imaging pixel detector will be shown.
引用
收藏
页码:329 / 337
页数:9
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