The Lund Nuclear Microprobe sub-micron set-up.: Part II:: Beam line, focusing system and scanning

被引：25

作者：

Shariff, A ^{[1
]}

Nilsson, C ^{[1
]}

Auzelyte, V ^{[1
]}

Elfman, M ^{[1
]}

Kristiansson, P ^{[1
]}

Malmqvist, K ^{[1
]}

Pallon, J ^{[1
]}

Wegdén, M ^{[1
]}

机构：

[1] Lund Univ, Inst Technol, Dept Nucl Phys, S-22100 Lund, Sweden

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 231卷

关键词：

sub-micron beam; Nuclear Microprobe; beam scanning; quadrupole doublets;

D O I：

10.1016/j.nimb.2005.01.027

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new beam line for generating a sub-micron beam spot for high-resolution nuclear microprobe applications has been constructed at the Lund Nuclear Microprobe facility. The design and construction of the beam line, the quality test of the four high precision Oxford OM-52 Quadrupole magnets by the grid shadow method and the beam scanning system are presented in this paper. The beam line is designed for a two-stage focusing system using an independent doublet at each stage. The first stage focuses the beam in an intermediate chamber, which has a scanning system and a high resolution viewing system. The beam spot in the intermediate chamber is then used as the object for the second stage. Slit construction, vacuum system and beam control is discussed. Data illustrating the quadrupole quality and scanning capability are shown. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：7 / 13

页数：7

共 3 条

[1] The Lund Nuclear Microprobe sub-micron set-up.: Part I:: Ion optics calculation
Shariff, A
Auzelyte, V
Elfman, M
Kristiansson, P
Malmqvist, K
Nilsson, C
Pallon, J
Wegdén, M
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 231 : 1 - 6
[2] The Lund Nuclear Microprobe sub-micron set-up.: Part III:: Sample stage, optical imaging and detector configuration in the experimental chamber
Elfman, M
Pallon, J
Auzelyte, V
Kristiansson, P
Malmqvist, K
Nilsson, C
Shariff, A
Wegdén, M
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 231 : 14 - 20
[3] Sub-micron focusing of hard X-ray beam by elliptically figured mirrors for scanning X-ray microscopy
Mori, Y
Yamauchi, K
Yamamura, K
Mimura, H
Sano, Y
Saito, A
Ueno, K
Endo, K
Souvorov, A
Yabashi, M
Tamasaku, K
Ishikawa, T
X-RAY MIRRORS, CRYSTALS, AND MULTILAYERS II, 2002, 4782 : 58 - 64

← 1 →