Characterisation of compact discs using time of flight-energy elastic recoil detection analysis

被引:2
|
作者
Zhang, YW
Possnert, G
Jonsson, L
Winzell, T
Whitlow, HJ
机构
[1] Uppsala Univ, Angstrom Lab, Div Ion Phys, SE-75121 Uppsala, Sweden
[2] M2 Engn AB, S-16391 Spanga, Sweden
[3] Lund Inst Technol, Div Nucl Phys, SE-22100 Lund, Sweden
关键词
optical storage media; phase-change; compact disc; CD-ROM; CD-R; CD-RW; ToF-E ERDA;
D O I
10.1143/JJAP.40.629
中图分类号
O59 [应用物理学];
学科分类号
摘要
The challenge of meeting the ever increasing demands for low-cost information storage media with greater information storage density and rapid access has prompted development of sophisticated optical technologies, e.g., compact disc (CD) and digital video disc (DVD) in read only memory (ROM), recordable (R), rewritable (RW) and random access memory (RAM). Here the suitability of time of flight-energy elastic recoil detection analysis (ToF-E ERDA) to characterise optical storage media film has been investigated. High-energy heavy ions (48 MeV Br-81(8+) and 60 MeV I-127(10+)) from a tandem accelerator were used to analyse CD-ROM, CD-R and CD-RW structures. Up to 9 elements, H, C, O Al, P, Co, Cr, Ge, and Sb/Te could be distinguished simultaneously. The results demonstrate the unique power of the technique for characterising the composition and depth profile of the optical multi-layers as well as the ingress and influence of foreign species.
引用
收藏
页码:629 / 633
页数:5
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