Ray tracing technique and its verification for the analysis of highly multimode optical waveguides with rough surfaces

被引:23
|
作者
Bierhoff, T [1 ]
Wallrabenstein, A
Himmler, A
Griese, E
Mrozynski, G
机构
[1] C LAB, Joint R&D Inst Univ Paderborn & Siemens AG, Paderborn, Germany
[2] Univ Gesamthsch Paderborn, D-33098 Paderborn, Germany
关键词
electromagnetic scattering by rough surfaces; geometrical optics; multimode waveguides; optical interconnection technology;
D O I
10.1109/20.952601
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel hybrid ray tracing technique for the analysis of signal propagation in highly multimode optical waveguides with rough surfaces and its verification in part is presented. The technique combines geometrical optics with a light scattering model, based on wave optics by applying a Monte Carlo method. While the light scattering model takes mode coupling caused by surface irregularities into account, the ray tracing technique provides the analysis of light propagation In highly multimode waveguides with arbitrary shapes. The verification is obtained by calculating wave propagation within a slab waveguide with rough surfaces applying the well known Coupled Power Theory, which provides the power of the guided modes versus the axial coordinate of the waveguide. Therefore, the ray tracing results are transformed into the discrete waveguide modes in order to compare the results.
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页码:3307 / 3310
页数:4
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