Neutron imaging based on transfer foil activation and COTS CMOS image sensors

被引：0
|
作者：
Perez, M. [1 ,2 ]
Abbate, O., I [2 ]
Lipovetzky, J. [1 ,2 ,3 ]
Bessia, F. Alcalde [1 ,3 ]
Sanchez, F. A. [1 ,2 ]
Sofo Haro, M. [1 ,2 ,3 ]
Longhino, J. [1 ,2 ]
Gomez Berisso, M. [1 ,2 ,3 ]
Blostein, J. J. [1 ,3 ]
机构：
[1] Univ Nacl Cuyo UNCUYO, Ctr Atom Bariloche, Inst Balseiro, Av E Bustillo 9500,R8402AGP, San Carlos De Bariloche, Rio Negro, Argentina
[2] Comis Nacl Energia Atom CNEA, Av E Bustillo 9500,R8402AGP, San Carlos De Bariloche, Rio Negro, Argentina
[3] Consejo Nacl Invest Cient & Tecn, Av E Bustillo 9500,R8402AGP, San Carlos De Bariloche, Rio Negro, Argentina
来源：
JOURNAL OF INSTRUMENTATION | 2022年 / 17卷 / 02期
关键词：
Inspection with neutrons; Neutron radiography; NUCLEAR-DATA; RADIOGRAPHY; EFFICIENCY; CONVERSION; RESOLUTION; SCIENCE;
D O I：
10.1088/1748-0221/17/02/P02004
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In this paper we present a method for obtention of neutron images with Commercial-Off-The-Shelf (COTS) CMOS image sensors through the activation of indium foils. This detection method has been designed specifically for the acquisition of thermal and epitermal neutron images in mixed beams with a high gamma flux, and also for the study of high radioactive samples that are usually placed into research reactor pools. We also present a technique to obtain multi-spectral neutron images taking advantage of the high neutron absorption cross-section of this material in the thermal energy range, as well as around the 1.45 eV resonance. Measurements performed in a neutron beam of the RA6 nuclear research reactor located in Bariloche, Argentina, confirm the capability of the proposed technique.
引用
收藏
页数：17
相关论文
共 50 条
  • [1] X-ray micrographic imaging system based on COTS CMOS sensors
    Alcalde Bessia, Fabricio
    Perez, Martin
    Lipovetzky, Jose
    Alejandra Piunno, Natalia
    Mateos, Horacio
    Sidelnik, Ivan
    Jeronimo Blostein, Juan
    Sofo Haro, Miguel
    Gomez Berisso, Mariano
    [J]. INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 2018, 46 (10) : 1848 - 1857
  • [2] X-ray Micrographic Imaging System Based on COTS CMOS Sensors
    Bessia, Alcalde F.
    Perez, M.
    Berisso, Gomez M.
    Piunno, N.
    Mateos, H.
    Pomiro, F. J.
    Sidelnik, I.
    Blostein, J. J.
    Haro, Sofo M.
    Lipovetzky, J.
    [J]. 2017 ARGENTINE CONFERENCE OF MICRO-NANOELECTRONICS, TECHNOLOGY AND APPLICATIONS (CAMTA), 2017, : 1 - 4
  • [3] A Low Cost Environmental Ionizing Radiation Detector Based on COTS CMOS Image Sensors
    Lucia Galimberti, Clara
    Alcalde Bessia, Fabricio
    Perez, Martin
    Gomez Berisso, Mariano
    Sofo Haro, Miguel
    Sidelnik, Ivan
    Blostein, Jeronimo
    Asorey, Hernan
    Lipovetzky, Jose
    [J]. 2018 IEEE BIENNIAL CONGRESS OF ARGENTINA (ARGENCON), 2018,
  • [4] A Potential-Based Characterization of the Transfer Gate in CMOS Image Sensors
    Xu, Yang
    Ge, Xiaoliang
    Theuwissen, Albert J. P.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (01) : 42 - 48
  • [5] A Charge Transfer Model for CMOS Image Sensors
    Han, Liqiang
    Yao, Suying
    Theuwissen, Albert J. P.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (01) : 32 - 41
  • [6] Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors
    Wang, Zujun
    Ma, Wuying
    Huang, Shaoyan
    Yao, Zhibin
    Liu, Minbo
    He, Baoping
    Liu, Jing
    Sheng, Jiangkun
    Xue, Yuan
    [J]. AIP ADVANCES, 2016, 6 (03)
  • [7] COTS CMOS Active Pixel Sensors Damage After Alpha, Thermal Neutron, and Gamma Irradiation
    Alcalde Bessia, Fabricio
    Perez, Martin
    Sidelnik, Ivan
    Sofo Haro, Miguel
    Jeronimo Blostein, J.
    Gomez Berisso, Mariano
    Marin, Julio
    Lipovetzky, Jose
    [J]. 2016 ARGENTINE CONFERENCE OF MICRO-NANOELECTRONICS, TECHNOLOGY AND APPLICATIONS (CAMTA), 2016, : 22 - 26
  • [8] X-ray imaging and spectroscopy using low cost COTS CMOS sensors
    Lane, David W.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 284 : 29 - 32
  • [9] CMOS-based image sensors
    Inoue, S
    [J]. IS&T'S NIP21: INTERNATIONAL CONFERENCE ON DIGITAL PRINTING TECHNOLOGIES, FINAL PROGRAM AND PROCEEDINGS, 2005, : 650 - 652
  • [10] Displacement Damage in CMOS Image Sensors After Thermal Neutron Irradiation
    Alcalde Bessia, Fabricio
    Perez, Martin
    Sofo Haro, Miguel
    Sidelnik, Ivan
    Jeronimo Blostein, J.
    Suarez, Sergio
    Perez, Pablo
    Gomez Berisso, Mariano
    Lipovetzky, Jose
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 65 (11) : 2793 - 2801
12345