Changes in the Photoluminescence of Monolayer and Bilayer Molybdenum Disulfide during Laser Irradiation
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作者:
Kim, Ho-Jong
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Korea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South Korea
Yonsei Univ, Dept Phys, Seoul 03722, South KoreaKorea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South Korea
Kim, Ho-Jong
[1
,2
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Yun, Yong Ju
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Konkuk Univ, Dept Energy Engn, Seoul 05029, South KoreaKorea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South Korea
Yun, Yong Ju
[3
]
Yi, Sam Nyung
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Korea Maritime & Ocean Univ, Dept Elect Mat Engn, Busan 49112, South KoreaKorea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South Korea
Yi, Sam Nyung
[4
]
Chang, Soo Kyung
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Yonsei Univ, Dept Phys, Seoul 03722, South KoreaKorea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South Korea
Chang, Soo Kyung
[2
]
Ha, Dong Han
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Korea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South KoreaKorea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South Korea
Ha, Dong Han
[1
]
机构:
[1] Korea Res Inst Stand & Sci, Quantum Technol Inst, Daejeon 34113, South Korea
[2] Yonsei Univ, Dept Phys, Seoul 03722, South Korea
[3] Konkuk Univ, Dept Energy Engn, Seoul 05029, South Korea
[4] Korea Maritime & Ocean Univ, Dept Elect Mat Engn, Busan 49112, South Korea
Various postsynthesis processes for transition metal dichalcogenides have been attempted to control the layer number and defect concentration, on which electrical and optical properties strongly depend. In this work, we monitored changes in the photoluminescence (PL) of molybdenum disulfide (MoS2) until laser irradiation generated defects on the sample flake and completely etched it away. Higher laser power was required to etch bilayer MoS2 compared to monolayer MoS2. When the laser power was 270 mu W with a full width at half-maximum of 1.8 mu m on bilayer MoS2, the change in PL intensity over time showed a double maximum during laser irradiation due to a layer-by-layer etching of the flake. When the laser power was increased to 405 mu W, however, both layers of bilayer MoS2 were etched all at once, which resulted in a single maximum in the change of PL intensity over time, as in the case of monolayer MoS2 . The dependence of the etching pattern for bilayer MoS2 on laser power was also reflected in position changes of both exciton and trion PL peaks. The subtle changes in the PL spectra of MoS2 as a result of laser irradiation found here are discussed in terms of PL quantum efficiency, conversion between trions and excitons, mean interatomic spacing, and the screening of Coulomb interaction.
机构:
Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R ChinaTsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Hou, Jiwei
Wang, Xi
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Wang, Xi
Fu, Deyi
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Fu, Deyi
Ko, Changhyun
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Ko, Changhyun
Chen, Yabin
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Chen, Yabin
Sun, Yufei
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Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R ChinaTsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Sun, Yufei
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Lee, Sangwook
Wang, Kevin X.
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Wang, Kevin X.
Dong, Kaichen
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
Tsinghua Univ, Dept Precis Instrument, Beijing 100084, Peoples R ChinaTsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Dong, Kaichen
Sun, Yinghui
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Univ Sci & Technol Beijing, Sch Math & Phys, Dept Phys, Beijing 100083, Peoples R ChinaTsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Sun, Yinghui
Tongay, Sefaattin
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Arizona State Univ, Sch Engn Matter Transport & Energy, Tempe, AZ 85287 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Tongay, Sefaattin
Jiao, Liying
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Tsinghua Univ, Dept Chem, Minist Educ, Key Lab Organ Optoelect & Mol Engn, Beijing 100084, Peoples R ChinaTsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Jiao, Liying
Yao, Jie
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Yao, Jie
Liu, Kai
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Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R ChinaTsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Liu, Kai
Wu, Junqiao
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USATsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
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Univ Zagreb, Dept Phys, Bijenicka 32, HR-10000 Zagreb, CroatiaUniv Zagreb, Dept Phys, Bijenicka 32, HR-10000 Zagreb, Croatia
Rukelj, Zoran
Strkalj, Antonio
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Univ Zagreb, Dept Phys, Bijenicka 32, HR-10000 Zagreb, CroatiaUniv Zagreb, Dept Phys, Bijenicka 32, HR-10000 Zagreb, Croatia
Strkalj, Antonio
Despoja, Vito
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Univ Zagreb, Dept Phys, Bijenicka 32, HR-10000 Zagreb, Croatia
DIPC, San Sebastian 20018, SpainUniv Zagreb, Dept Phys, Bijenicka 32, HR-10000 Zagreb, Croatia