Strain Compensated InGaAs/AlAs Triple Barrier Resonant Tunneling Structures for THz Applications

被引:7
|
作者
Allford, Craig P. [1 ,2 ]
Buckle, Philip D. [1 ]
机构
[1] Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales
[2] Univ Warwick, Sch Engn, Coventry CV4 7AL, W Midlands, England
基金
英国工程与自然科学研究理事会;
关键词
Resonant tunneling diodes (RTDs); SUB-TERAHERTZ; DIODES; OSCILLATIONS; FREQUENCY; OPERATION; DEVICE; GHZ;
D O I
10.1109/TTHZ.2017.2758266
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report a theoretical study of InGaAs/AlAs triple barrier resonant tunneling heterostructures, which are optimized for operation in the terahertz frequency range, and compare these to current state-of-the-art double barrier structures reported in the literature. We consider the effect of strain introduced due to the large lattice mismatch between the substrate, quantum well, and potential barrier materials and describe designs with strain compensated active regions. Constraints have been imposed on the designs to minimize charge accumulation in the emitter quantum well, which is often associated with more complex triple barrier structures. The use of a triple barrier structure suppresses the off-resonance leakage current, thus increasing the maximum output power density, with approximate to 3 mW mu m(-2) predicted at 1 THz. The use of thinner potential barriers also reduces the carrier transit time through the structure, which increases the maximum output frequency, predicted to be >= 4 THz for optimized structures.
引用
收藏
页码:772 / 779
页数:8
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